Two probabilistic models for 2-out-of-3 redundant system o f identical units are developed. The system is
considered in up-state if 2-out-of-3 units are operative. Repair facility is provided immediately whenever
needed in model 1 while server takes some time to arrive at the system in m odel 2. The distribution o f repair and
w aiting tim e are taken as general w ith different probability density fu n ctions (pdf) whereas failure time
distribution o f the unit is negative exponential. Regenerative point technique is adopted to derive the
expressions fo r some reliability and economic measures. Graphs are plotted to discuss reliability and costbenefit analysis o f the models for a particular case. The applications o f the present models can be seen in
computer, electrical and m echanical systems. The paper suggests that 2-out-of-3 redundant systems can be
m ade more reliable and profitable by providing components oflow failure rates vand im mediate repairfacility.
Reliability and Cost-Benefit Analysis of 2-Out-of-3 Redundant Systems with General Distribution of Repair and Waiting Time
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Published 2007-04-30
Pages 28-35
Abstract
References
- Chiang, D. T. and Niu, S. C. (1981).
- Reliability of Consecutive K-out-of-n:F system, IEEE Transactions on Reliability, R-30, 87–89.
- Dhillon, B. S. (1992).
- Stochastic modeling of k-out-of-n units family of system, International Journal of Systems Sciences, 28(8), 1277–1287.
- Goel, L. R., Sharma, G. C. and Gupta, R. (1985).
- Cost analysis of two-unit cold standby system under different weather conditions, Microelectronics Reliability, 25(4), 655–659.
- Kadyan, M. S., Chander, S. and Grewal, A. S. (2004).
- Stochastic analysis of non-identical units reliability models with priority and different modes of failure, Decision and Mathematical Sciences, 9(1–3), 59–82.
- Mishra, K. B. and Balagurusamy, E. (1976).
- Reliability analysis of k-out-of-m:G system with dependent failures, International Journal of Systems Science, Vol. 7, No. 8, 853–861.
- Murari, K. and Goyal, V. (1984).
- Comparison of two-unit cold standby reliability models with three types of repair facilities, Microelectronics Reliability, 24(1), 35–49.
- Mokaddis, G. S., Labib, S. W. and Ahmed, A. M. (1997).
- Analysis of a two-unit warm standby system subject to degradation, Microelectronics Reliability, 37, 641–648.
- Tuteja, R. K. and Malik, S. C. (1994).
- A system with pre-inspection and two types of repairmen, Microelectronics Reliability, Vol. 54, No. 2, pp. 373–377.
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